Adaptive Low-Power Circuits for Wireless Communications by Aleksandar Tasic, Wouter A. Serdijn, John R. Long

By Aleksandar Tasic, Wouter A. Serdijn, John R. Long

With 1000000000 – quickly to be billion - mobile phones in movement, the subsequent problem is to make mobile radio features adaptive to their setting. This ebook offers a accomplished theoretical framework for optimizing functionality, discussing joint optimization of Noise determine and enter Intercept aspect in receiver platforms. additionally tested are unique ideas to optimize voltage managed oscillators and low-noise amplifiers, minimizing strength intake whereas conserving sufficient method functionality.

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Sansen, Distortion Analysis of Analog Integrated Circuits, Kluwer Academic Publishers, Boston, 1998. [39] S. Narayanan, “Intermodulation Distortion of Cascaded Transistors,” IEEE Journal of Solid-State Circuits, vol. SC-4, no. 3, pp. 97-106, Jun 1969. [40] B. P. Gross, “Calculating the Cascade Intercept Point of Communications Receivers”, Ham Radio, pp. 50-52, August 1980. [41] D. O. North, “The Absolute Sensitivity of Radio Receivers”, RCA Review, vol. 6, pp. 332-343, January 1928. [42] H. Rothe and W.

457-467, October 1959. [25] B. Ebstein, R. Huenemann and R. Sea, “The Correspondence of Intermodulation and Cross Modulation in Amplifiers and Mixers”, Proceedings of the IEEE, pp. 1514-1516, August 1967, (see comments in pp. 355-357, March 1968). [26] B. H. Goldberg, “Predict Intermodulation Distortion”, Electronic Design, pp. 76-78, May 1970. [27] M. E. Goldfarb, “Intermodulation Products,” Microwave Journal, pp. 297-301, May 1985. [28] L. Sheng, C. Jensen and L. E. Larson, “A Wide-Bandwidth Si/SiGe HBT Direct Conversion Sun-Harmonic Mixer/Downconverter”, IEEE Journal of Solid-State Circuits, vol.

29) where *OPT is the optimum reflection coefficient corresponding to the optimum source admittance that provides the minimum noise factor, and *S is the source reflection coefficient. The noise parameters, FMIN, RN, and *OPT, are characteristics of the device, and they can be measured with a noise-figure test set, or determined from the device S-parameters. Another noise figure of merit is the noise temperature, TE [48]. By referring to Fig. 4, we can establish the relationship between the noise factor and noise temperature as follows.

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